The proposed methods of errors summation for direct multiple measurements and the accepted according to GOST R 8.736–2011methods have been considered. The practical recommendations and the examples of estimation of random and non-exclusive systematic error components summation results are given.

A comparative estimation of the gain of antinoiseconding of data link channels by correction codes is carried out. The codes realize the cyclic and linear information coding for errorbytes correction.

The method of multi-angle depolarized dynamic light scattering allowing to determine the length and diameter of non-spherical nanoparticles of nanometer and submicron ranges is considered. Its advantages and disadvantages compared with other methods of nanoparticles geometrical parameters measurement are analyzed. Several ways for instrumental improvement of this method and development of calculation algorithms are considered.

The estimation of uncertainty of lattice spacing measurements in silicon by means of laboratory diffractometer Bruker D8 DISCOVER with use of certified reference material NIST SRM-2000 is presented.

A method of creation of samples of monodisperse ensemble of spherical silicon oxide nanoparticles with diameter of (26,6±3,5) nm uniformly distributed on the 1 cm² surface of single-crystal silicon substrate with average surface concentration of particles of about 0,5 pieces/μm² was developed. The use of obtained test structure for determination of the effective radius of tip of an atomic force microscope probe is demonstrated.

Recommendations for development and practical application of the proposed procedure of introduction into results of measurements of thermophysical properties are discussed.