A review of various optoelectronic devices for linear measurements is given. Their design and metrological characteristics are discussed.

The medium-term scanning electron microscopes scale factor stability was ascertained with use of the measure MShPS-2.0K during 5 days. The results are 3±0,6% for SEM Hitachi S-4800, 2±0,6% for Jeol JSM-7001F, 5±0,6% for FEI Quanta 200. It was also ascertained that the scale factor depends on working distance between the sample and objective lens. The results are 6,5±0,6 %, 8±0,6 %, 6,5±0,6% for analyzed SEM models, respectively. Thereby to provide more accurate measurements the direct comparison between the sample parameters and reference material parameters with the same SEM settings is necessary.

In this article the basic problems arising by working out of not cooled gauges of dynamic pressure have been designated. The developed ways of their decision are brought. Given sensor design, realizing compensation error of the output signal of the temperature.

The brief review of methods of different types of nozzles and input confusers geneatrixes construction is presented. On the basis of variations calculus methods the profile construction method ensuring the minimal friction and vortex formation losses is suggested.

The measurement error of measurements of steels maximum permeability μ_m by standard procedure caused by discrete change of magnetizing field amplitude on the basic magnetization curve by induction was analyzed. It is shown that the work content of these measurements can be reduced by using of a formula of calculation of field, at which the steel permeability is highest possible.