metrolМетрологияMetrologiya0132-47132712-9071ВНИИМСmetrol-142Research ArticleОПТИКО-ФИЗИЧЕСКИЕ ИЗМЕРЕНИЯОбзор методов и средств измерений мощности лазерного излучения малых уровнейМикрюковА. С.anzio64@gmail.ruВсероссийский научно-исследовательский институт оптико-физических измерений, МоскваRussian Federation201307022023012438Copyright © ВНИИМС, 20232023ВНИИМСВНИИМСhttps://metrol.elpub.ru/jour/about/submissions#copyrightNoticehttps://metrol.elpub.ru/jour/article/view/142

Представлен обзор современного состояния развития методов и средств измерений мощности малых уровней. Показано, что создание приемников-счетчиков фотонов является наиболее перспективным способом для расчета внутренней квантовой эффективности кремниевых фотодиодов, а также единственным, позволяющим осуществить независимую связь единицы ватт с фундаментальными физическими постоянными.

An overview of the current state of development of methods and instruments of low power levels measurement is presented. It is shown that the creation of photon receivers-counters is the most promising method for calculation of silicon photodiodes internal quantum efficiency and the only method allowing to establish the independent connection of watt unit with the basic physical constants.

малые уровни мощностисчет фотоновтрап-детекторквантовая эффективностьlow power levelsphotons counttrap detectorquantum efficiencyReferencesИванов В. С. и др. Основы оптической радиометрии. М.: Физматлит, 2003. С. 544.Иванов В. С. и др. Основы оптической радиометрии. М.: Физматлит, 2003. С. 544.Schrama C. A. e. a. Comparison of monochromator-based and laser-based cryogenic radiometry // Metrologia. 1998. V. 35. P. 431– 435.Schrama C. A. e. a. Comparison of monochromator-based and laser-based cryogenic radiometry // Metrologia. 1998. V. 35. P. 431– 435.Geist J., Zalewski E. F., Schaefer A. R. Spectral response self-calibration andinterpolation of silicon photodiodes // Appl. Opt. 1980. V. 19, N 22. P. 3795 – 3799.Geist J., Zalewski E. F., Schaefer A. R. Spectral response self-calibration andinterpolation of silicon photodiodes // Appl. Opt. 1980. V. 19, N 22. P. 3795 – 3799.Key P. J., Fox N. P., Rastello M. L. Oxide-Bias Measurements In the Silicon Photodiode Self-Calibration Technique // Metrologia. 1985. V. 21. P. 81.Key P. J., Fox N. P., Rastello M. L. Oxide-Bias Measurements In the Silicon Photodiode Self-Calibration Technique // Metrologia. 1985. V. 21. P. 81.Fox N. P. Trap Detectors and their Properties // Metrologia. 1991. V. 28. P. 197 – 202.Fox N. P. Trap Detectors and their Properties // Metrologia. 1991. V. 28. P. 197 – 202.Basore P. A., Clugson D. A. [Электрон. версия]. http://sourceforge.net/projects/pc1d (дата обращения 15.01.2013).Basore P. A., Clugson D. A. [Электрон. версия]. http://sourceforge.net/projects/pc1d (дата обращения 15.01.2013).Synopsus [Офиц. сайт] http://synopsys.com (дата обращения 18.12.2012).Synopsus [Офиц. сайт] http://synopsys.com (дата обращения 18.12.2012).Mountford J. e. a. Development of a switched integrator amplifier for high-accuracy optical measurements // Appl. Opt. 2008. V. 47. P. 5821.Mountford J. e. a. Development of a switched integrator amplifier for high-accuracy optical measurements // Appl. Opt. 2008. V. 47. P. 5821.Porrovecchio G. e. a. A transfer standard for the low power / few photon regime – the trap detector plus switched integrator amplifier // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 110.Porrovecchio G. e. a. A transfer standard for the low power / few photon regime – the trap detector plus switched integrator amplifier // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 110.Migdall A. Correlated-Photon Metrology Without Absolute Standards //Phys. Today. 1999. P. 41– 46.Migdall A. Correlated-Photon Metrology Without Absolute Standards //Phys. Today. 1999. P. 41– 46.Rastello M. L. Metrology towards quantum-based photon standarts // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 109.Rastello M. L. Metrology towards quantum-based photon standarts // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 109.Geist J., Liang E., Schaefer A. R. J. Complete collection of minority carriers from the inversion layer in induced junction diodes // Appl. Phys. 1981. V. 52. P. 4879.Geist J., Liang E., Schaefer A. R. J. Complete collection of minority carriers from the inversion layer in induced junction diodes // Appl. Phys. 1981. V. 52. P. 4879.Zalewski E. F., Hoyt C. C. Comparison Between Cryogenic Radiometry and the Predicted Quantum Efficiency of pn Silicon Photodiode Light Traps // Metrologia. 1991. V. 28. P. 203 – 206.Zalewski E. F., Hoyt C. C. Comparison Between Cryogenic Radiometry and the Predicted Quantum Efficiency of pn Silicon Photodiode Light Traps // Metrologia. 1991. V. 28. P. 203 – 206.Pat. 4.498.012 USA. 1985.Pat. 4.498.012 USA. 1985.Saito T. Optical properties of semiconductor photodiodes/solar cells // Metrologia. 2012. V. 49. P. S118 – S123.Saito T. Optical properties of semiconductor photodiodes/solar cells // Metrologia. 2012. V. 49. P. S118 – S123.Gentile T. R., Houston J. M., Cromer C. L. Realization of a scale of absolute spectral response using the NIST high accuracy cryogenic radiometer // Appl. Opt. 1996. V. 35. P. 4392 – 4403.Gentile T. R., Houston J. M., Cromer C. L. Realization of a scale of absolute spectral response using the NIST high accuracy cryogenic radiometer // Appl. Opt. 1996. V. 35. P. 4392 – 4403.Schaefer A. R., Zalewski E. F., Geist J. Silicon detector nonlinearity and related effects // Appl. Opt. 1983. V. 22. P. 1232 – 1236.Schaefer A. R., Zalewski E. F., Geist J. Silicon detector nonlinearity and related effects // Appl. Opt. 1983. V. 22. P. 1232 – 1236.Eppeldauer G. P., Lynch D. C. Opto-Mechanical and Electronic Design of a Tunnel-Trap Si Radiometer // J. Res. Natl. Inst. Stand. Technol. 2000. V. 105. N 6. P. 813 – 828.Eppeldauer G. P., Lynch D. C. Opto-Mechanical and Electronic Design of a Tunnel-Trap Si Radiometer // J. Res. Natl. Inst. Stand. Technol. 2000. V. 105. N 6. P. 813 – 828.Goebel R., Yilmaz S., Pello R. Polarization dependence of trap detectors // Metrologia. 1996. V. 33. P. 207 – 213.Goebel R., Yilmaz S., Pello R. Polarization dependence of trap detectors // Metrologia. 1996. V. 33. P. 207 – 213.Carter A. C. e. a. Absolute cryogenic radiometer and solid-state trap detectors for IR power scales down to 1 pW with 0,1% uncertainty // Metrologia. 2009. V. 46. P. S146 – S150.Carter A. C. e. a. Absolute cryogenic radiometer and solid-state trap detectors for IR power scales down to 1 pW with 0,1% uncertainty // Metrologia. 2009. V. 46. P. S146 – S150.Migdall A. e. a. Single-Photon Tools, Techniques, and Prospects for Metrology// Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 108.Migdall A. e. a. Single-Photon Tools, Techniques, and Prospects for Metrology// Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 108.Geist J., Baltes H. High accuracy modeling of photodiode quantum efficiency // Appl. Opt. 1989. V. 28. N 18. P. 3929 – 3939.Geist J., Baltes H. High accuracy modeling of photodiode quantum efficiency // Appl. Opt. 1989. V. 28. N 18. P. 3929 – 3939.Gran J. e. a. Simulations of a predictable quantum efficient detector with PC1D // Metrologia. 2012. V. 49. P. 130 – 134.Gran J. e. a. Simulations of a predictable quantum efficient detector with PC1D // Metrologia. 2012. V. 49. P. 130 – 134.Schmunk W. e. a. Relative detection efficiency calibration of single photon avalanche photo detectors using non-classical light // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 111.Schmunk W. e. a. Relative detection efficiency calibration of single photon avalanche photo detectors using non-classical light // Proc. 5th Single Photon Workshop. Germany: PTB, 2011. P. 111.Hofer H., Lopez M., Kück S. Fiber-based power measurement for the optical telecommunication in a wide spectral range // Proc. Intern. Conf. New Develop. and Appl. Opt. Radiometry. Korea, Daejeon: KRISS, 2008. P. 105 – 106.Hofer H., Lopez M., Kück S. Fiber-based power measurement for the optical telecommunication in a wide spectral range // Proc. Intern. Conf. New Develop. and Appl. Opt. Radiometry. Korea, Daejeon: KRISS, 2008. P. 105 – 106.

The authors declare that there are no conflicts of interest present.